PXIE-1085 PXI Express chassis

PXIE-1085 is a high-performance PXI Express chassis launched by National Instruments (NI). This chassis is designed specifically for high-throughput applications and utilizes PCI Express third-generation technology. Through PCIe x8 third-generation links connected to each slot, it achieves a bandwidth of 8 GB/s per slot and 24 GB/s system bandwidth. The PXIE-1085 chassis can provide a total power of 925W over the entire temperature range (0-55 ℃) without derating. This means that the power supply can provide 38.25W of power to each slot in the chassis, meeting the needs of high-performance instruments. In addition, the chassis also has the function of monitoring the health status and voltage of the power supply, the intake temperature, and the health status and speed of the fan.

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Desciption

Users can obtain fault feedback through the LED status indicator lights located on the front panel of the chassis, or remotely monitor the health information of the chassis through the web service portal and Ethernet connection at the back of the chassis. The PXIE-1085 chassis also has a high degree of serviceability, with a hot swappable cooling fan on the back end and a detachable power supply. This makes maintenance and upgrades more convenient. In addition to the hardware features mentioned above, the PXIE-1085 chassis can also be compatible with various PXI, PXI Express, CompactPCI, and CompactPCI Express modules, providing users with great flexibility. In addition, it can also be used as part of a unidirectional broadband vector signal testing system, combined with other instruments such as the NI PXIE-5644R/5645R/5646R vector signal transmitter and receiver (VST), to achieve the analysis and generation of vector signals. Overall, PXIE-1085 is a high-performance, high-throughput PXI Express chassis suitable for various application scenarios that require high-precision and high-speed data collection and generation, such as industrial automation, testing and measurement, control systems, etc.

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